Remaining Useful Life Prediction of Electronic Products Based on Wiener Degradation Process
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IFAC-PapersOnLine
سال: 2019
ISSN: 2405-8963
DOI: 10.1016/j.ifacol.2019.12.372